B. Li, A. Boyer, S. Bendhia, C. Lemoine. Ageing effect on electromagnetic susceptibility of a phase locked loop. Microelectronics Reliability, 50(9-11):1304-1308, 2010. [doi]
@article{LiBBL10,
title = {Ageing effect on electromagnetic susceptibility of a phase locked loop},
author = {B. Li and A. Boyer and S. Bendhia and C. Lemoine},
year = {2010},
doi = {10.1016/j.microrel.2010.07.100},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.100},
tags = {C++},
researchr = {https://researchr.org/publication/LiBBL10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1304-1308},
}