Hai Helen Li, Yiran Chen, Chenchen Liu, John Paul Strachan, Noraica Davila. Looking Ahead for Resistive Memory Technology: A broad perspective on ReRAM technology for future storage and computing. IEEE Consumer Electronics Magazine, 6(1):94-103, 2017. [doi]
@article{LiCLSD17,
title = {Looking Ahead for Resistive Memory Technology: A broad perspective on ReRAM technology for future storage and computing},
author = {Hai Helen Li and Yiran Chen and Chenchen Liu and John Paul Strachan and Noraica Davila},
year = {2017},
doi = {10.1109/MCE.2016.2614523},
url = {http://dx.doi.org/10.1109/MCE.2016.2614523},
researchr = {https://researchr.org/publication/LiCLSD17},
cites = {0},
citedby = {0},
journal = {IEEE Consumer Electronics Magazine},
volume = {6},
number = {1},
pages = {94-103},
}