Stan Z. Li, Kap Luk Chan, Changliang Wang. Performance Evaluation of the Nearest Feature Line Method in Image Classification and Retrieval. IEEE Trans. Pattern Anal. Mach. Intell., 22(11):1335-1349, 2000. [doi]
@article{LiCW00,
title = {Performance Evaluation of the Nearest Feature Line Method in Image Classification and Retrieval},
author = {Stan Z. Li and Kap Luk Chan and Changliang Wang},
year = {2000},
url = {http://www.computer.org/tpami/tp2000/i1335abs.htm},
tags = {classification},
researchr = {https://researchr.org/publication/LiCW00},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Pattern Anal. Mach. Intell.},
volume = {22},
number = {11},
pages = {1335-1349},
}