Xiyue Li, Wanling Deng, Junkai Huang. Determination of the trap states distribution in Poly-Si films using the OEMS modulation. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 669-672, IEEE, 2011. [doi]
@inproceedings{LiDH11-1,
title = {Determination of the trap states distribution in Poly-Si films using the OEMS modulation},
author = {Xiyue Li and Wanling Deng and Junkai Huang},
year = {2011},
doi = {10.1109/ASICON.2011.6157294},
url = {http://dx.doi.org/10.1109/ASICON.2011.6157294},
researchr = {https://researchr.org/publication/LiDH11-1},
cites = {0},
citedby = {0},
pages = {669-672},
booktitle = {2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011},
publisher = {IEEE},
isbn = {978-1-61284-192-2},
}