Using k-d Trees for Robust 3D Point Pattern Matching

Baihua Li, Horst Holstein. Using k-d Trees for Robust 3D Point Pattern Matching. In 4th International Conference on 3D Digital Imaging and Modeling (3DIM 2003), 6-10 October 2003, Banff, Canada. pages 95-102, IEEE Computer Society, 2003. [doi]

@inproceedings{LiH03:5,
  title = {Using k-d Trees for Robust 3D Point Pattern Matching},
  author = {Baihua Li and Horst Holstein},
  year = {2003},
  url = {http://csdl.computer.org/comp/proceedings/3dim/2003/1991/00/19910095abs.htm},
  tags = {tree pattern matching, pattern matching},
  researchr = {https://researchr.org/publication/LiH03%3A5},
  cites = {0},
  citedby = {0},
  pages = {95-102},
  booktitle = {4th  International Conference on 3D Digital Imaging and Modeling (3DIM 2003), 6-10 October 2003, Banff, Canada},
  publisher = {IEEE Computer Society},
  isbn = {0-7695-1991-1},
}