Software Defect Prediction via Convolutional Neural Network

Jian Li, Pinjia He, Jieming Zhu, Michael R. Lyu. Software Defect Prediction via Convolutional Neural Network. In 2017 IEEE International Conference on Software Quality, Reliability and Security, QRS 2017, Prague, Czech Republic, July 25-29, 2017. pages 318-328, IEEE, 2017. [doi]

Authors

Jian Li

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Pinjia He

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Jieming Zhu

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Michael R. Lyu

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