You Li, Zhiqiang Liu, Degang Chen. Efficient Verification Against Undesired Operating Points for MOS Analog Circuits. IEEE Trans. on Circuits and Systems, 64(8):2134-2145, 2017. [doi]
@article{LiLC17-1,
title = {Efficient Verification Against Undesired Operating Points for MOS Analog Circuits},
author = {You Li and Zhiqiang Liu and Degang Chen},
year = {2017},
doi = {10.1109/TCSI.2017.2693208},
url = {https://doi.org/10.1109/TCSI.2017.2693208},
researchr = {https://researchr.org/publication/LiLC17-1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {64},
number = {8},
pages = {2134-2145},
}