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Uncover Product Review Patterns via Weighted Motifs

Jiandun Li, Pin Lv, Chunlei Ji. Uncover Product Review Patterns via Weighted Motifs. In 5th International Conference on Systems and Informatics, ICSAI 2018, Nanjing, China, November 10-12, 2018. pages 445-448, IEEE, 2018. [doi]

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