Pengfei Li, Xuan Lin, Junfeng Jing, Lei Zhang. Defect Detection in Fabrics Using Local Binary Patterns. In Tieniu Tan, Qiuqi Ruan, Shengjin Wang, Huimin Ma, Kaiqi Huang, editors, Advances in Image and Graphics Technologies - Chinese Conference, IGTA 2014, Beijing, China, June 19-20, 2014. Proceedings. Volume 437 of Communications in Computer and Information Science, pages 274-283, Springer, 2014. [doi]
@inproceedings{LiLJZ14,
title = {Defect Detection in Fabrics Using Local Binary Patterns},
author = {Pengfei Li and Xuan Lin and Junfeng Jing and Lei Zhang},
year = {2014},
doi = {10.1007/978-3-662-45498-5_31},
url = {https://doi.org/10.1007/978-3-662-45498-5_31},
researchr = {https://researchr.org/publication/LiLJZ14},
cites = {0},
citedby = {0},
pages = {274-283},
booktitle = {Advances in Image and Graphics Technologies - Chinese Conference, IGTA 2014, Beijing, China, June 19-20, 2014. Proceedings},
editor = {Tieniu Tan and Qiuqi Ruan and Shengjin Wang and Huimin Ma and Kaiqi Huang},
volume = {437},
series = {Communications in Computer and Information Science},
publisher = {Springer},
isbn = {978-3-662-45497-8},
}