Stochastic Analysis on RAID Reliability for Solid-State Drives

Yongkun Li, Patrick P. C. Lee, John C. S. Lui. Stochastic Analysis on RAID Reliability for Solid-State Drives. In IEEE 32nd Symposium on Reliable Distributed Systems, SRDS 2013, Braga, Portugal, 1-3 October 2013. pages 71-80, IEEE, 2013. [doi]

Authors

Yongkun Li

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Patrick P. C. Lee

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John C. S. Lui

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