T pattern fuse construction in segment metallized film capacitors based on self-healing characteristics - researchr publication authors

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Haoyuan Li, Hua Li, Zhiwei Li, Fuchang Lin, De Liu, Wenjuan Wang, Bowen Wang, Zhijian Xu. T pattern fuse construction in segment metallized film capacitors based on self-healing characteristics. Microelectronics Reliability, 55(6):945-951, 2015. [doi]

This author has not been identified. Look up 'Haoyuan Li' in GoogleThis author has not been identified. Look up 'Hua Li' in GoogleThis author has not been identified. Look up 'Zhiwei Li' in GoogleThis author has not been identified. Look up 'Fuchang Lin' in GoogleThis author has not been identified. It may be one of the following persons:

De Liu

Look up 'De Liu' in GoogleThis author has not been identified. Look up 'Wenjuan Wang' in GoogleThis author has not been identified. Look up 'Bowen Wang' in GoogleThis author has not been identified. Look up 'Zhijian Xu' in Google

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