Yaguang Li, Yishuang Lin, Meghna Madhusudan, Arvind K. Sharma, Sachin S. Sapatnekar, Ramesh Harjani, Jiang Hu. A Circuit Attention Network-Based Actor-Critic Learning Approach to Robust Analog Transistor Sizing. In 3rd ACM/IEEE Workshop on Machine Learning for CAD, MLCAD 2021, Raleigh, NC, USA, August 30 - Sept. 3, 2021. pages 1-6, IEEE, 2021. [doi]
@inproceedings{LiLMSSHH21,
title = {A Circuit Attention Network-Based Actor-Critic Learning Approach to Robust Analog Transistor Sizing},
author = {Yaguang Li and Yishuang Lin and Meghna Madhusudan and Arvind K. Sharma and Sachin S. Sapatnekar and Ramesh Harjani and Jiang Hu},
year = {2021},
doi = {10.1109/MLCAD52597.2021.9531156},
url = {https://doi.org/10.1109/MLCAD52597.2021.9531156},
researchr = {https://researchr.org/publication/LiLMSSHH21},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {3rd ACM/IEEE Workshop on Machine Learning for CAD, MLCAD 2021, Raleigh, NC, USA, August 30 - Sept. 3, 2021},
publisher = {IEEE},
isbn = {978-1-6654-3166-8},
}