Predicting software black-box defects using stacked generalization

Ning Li, Zhanhuai Li, Yanming Nie, Xiling Sun, Xia Li. Predicting software black-box defects using stacked generalization. In Sixth IEEE International Conference on Digital Information Management, ICDIM 2011, Melbourne, Australia, September 26-28, 2011. pages 294-299, IEEE, 2011. [doi]

Authors

Ning Li

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Zhanhuai Li

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Yanming Nie

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Xiling Sun

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Xia Li

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