Yi Li, Junyan Ma, Te Zhang. HATBED: Hardware Assisted Tracing Testbed for Embedded Networked Sensor Systems. In Gowri Sankar Ramachandran, Bhaskar Krishnamachari, editors, Proceedings of the 16th ACM Conference on Embedded Networked Sensor Systems, SenSys 2018, Shenzhen, China, November 4-7, 2018. pages 327-328, ACM, 2018. [doi]
@inproceedings{LiMZ18-3,
title = {HATBED: Hardware Assisted Tracing Testbed for Embedded Networked Sensor Systems},
author = {Yi Li and Junyan Ma and Te Zhang},
year = {2018},
doi = {10.1145/3274783.3275166},
url = {https://doi.org/10.1145/3274783.3275166},
researchr = {https://researchr.org/publication/LiMZ18-3},
cites = {0},
citedby = {0},
pages = {327-328},
booktitle = {Proceedings of the 16th ACM Conference on Embedded Networked Sensor Systems, SenSys 2018, Shenzhen, China, November 4-7, 2018},
editor = {Gowri Sankar Ramachandran and Bhaskar Krishnamachari},
publisher = {ACM},
isbn = {978-1-4503-5952-8},
}