Time-Domain Analysis of Optimum Bias Point in Inverse Class-F Power Amplifiers

Yifei Li, Nathan M. Neihart. Time-Domain Analysis of Optimum Bias Point in Inverse Class-F Power Amplifiers. In IEEE International Symposium on Circuits and Systems, ISCAS 2018, 27-30 May 2018, Florence, Italy. pages 1-4, IEEE, 2018. [doi]

Authors

Yifei Li

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Nathan M. Neihart

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