Zhixing Li, Weiping Shi. Layout Capacitance Extraction Using Automatic Pre-Characterization and Machine Learning. In 21st International Symposium on Quality Electronic Design, ISQED 2020, Santa Clara, CA, USA, March 25-26, 2020. pages 457-464, IEEE, 2020. [doi]
@inproceedings{LiS20a-2,
title = {Layout Capacitance Extraction Using Automatic Pre-Characterization and Machine Learning},
author = {Zhixing Li and Weiping Shi},
year = {2020},
doi = {10.1109/ISQED48828.2020.9136970},
url = {https://doi.org/10.1109/ISQED48828.2020.9136970},
researchr = {https://researchr.org/publication/LiS20a-2},
cites = {0},
citedby = {0},
pages = {457-464},
booktitle = {21st International Symposium on Quality Electronic Design, ISQED 2020, Santa Clara, CA, USA, March 25-26, 2020},
publisher = {IEEE},
isbn = {978-1-7281-4207-4},
}