Hui Li, Xiaohua Shi, Kejun Li, Hongyu Yu. Development of electrostatic decay time intelligent test instrument and software design. In Yihai Chen, editor, 17th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2016, Shanghai, China, May 30 - June 1, 2016. pages 523-526, IEEE Computer Society, 2016. [doi]
@inproceedings{LiSLY16,
title = {Development of electrostatic decay time intelligent test instrument and software design},
author = {Hui Li and Xiaohua Shi and Kejun Li and Hongyu Yu},
year = {2016},
doi = {10.1109/SNPD.2016.7515952},
url = {http://doi.ieeecomputersociety.org/10.1109/SNPD.2016.7515952},
researchr = {https://researchr.org/publication/LiSLY16},
cites = {0},
citedby = {0},
pages = {523-526},
booktitle = {17th IEEE/ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2016, Shanghai, China, May 30 - June 1, 2016},
editor = {Yihai Chen},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-2239-7},
}