The topology and test technology of Digitally Controlled Potentiometers - researchr publication authors

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Wei Li, Zhan-You Sha, Bin Wang. The topology and test technology of Digitally Controlled Potentiometers. In International Conference on Machine Learning and Cybernetics, ICMLC 2010, Qingdao, China, July 11-14, 2010, Proceedings. pages 2345-2349, IEEE, 2010. [doi]

This author has not been identified. Look up 'Wei Li' in GoogleThis author has not been identified. Look up 'Zhan-You Sha' in GoogleThis author has not been identified. Look up 'Bin Wang' in Google

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