Ting Li, Yu Su, Lanhui Wu, Boan Pan, Yan Li. Reliability analysis of a newly developed detector for monitoring spine health. Microelectronics Reliability, 78:411-414, 2017. [doi]
@article{LiSWPL17,
title = {Reliability analysis of a newly developed detector for monitoring spine health},
author = {Ting Li and Yu Su and Lanhui Wu and Boan Pan and Yan Li},
year = {2017},
doi = {10.1016/j.microrel.2017.05.026},
url = {https://doi.org/10.1016/j.microrel.2017.05.026},
researchr = {https://researchr.org/publication/LiSWPL17},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {78},
pages = {411-414},
}