An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations

Xin Li, Jin Sun, Fu Xiao, Jiangshan Tian. An efficient bi-objective optimization framework for statistical chip-level yield analysis under parameter variations. Journal of Zhejiang University - Science C, 17(2):160-172, 2016. [doi]

Authors

Xin Li

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Jin Sun

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Fu Xiao

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Jiangshan Tian

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