Dewei Li, Jingjing Tang, Yingjie Tian, Xuchan Ju. Multi-view deep metric learning for image classification. In 2017 IEEE International Conference on Image Processing, ICIP 2017, Beijing, China, September 17-20, 2017. pages 4142-4146, IEEE, 2017. [doi]
@inproceedings{LiTTJ17,
title = {Multi-view deep metric learning for image classification},
author = {Dewei Li and Jingjing Tang and Yingjie Tian and Xuchan Ju},
year = {2017},
doi = {10.1109/ICIP.2017.8297062},
url = {https://doi.org/10.1109/ICIP.2017.8297062},
researchr = {https://researchr.org/publication/LiTTJ17},
cites = {0},
citedby = {0},
pages = {4142-4146},
booktitle = {2017 IEEE International Conference on Image Processing, ICIP 2017, Beijing, China, September 17-20, 2017},
publisher = {IEEE},
isbn = {978-1-5090-2175-8},
}