Generating and reducing test case based on covering rough sets

Wenyan Li, Jiyi Wang, Gaomin Lin. Generating and reducing test case based on covering rough sets. In The 2009 IEEE International Conference on Granular Computing, GrC 2009, Lushan Mountain, Nanchang, China, 17-19 August 2009. pages 368-372, IEEE, 2009. [doi]

@inproceedings{LiWL09-4,
  title = {Generating and reducing test case based on covering rough sets},
  author = {Wenyan Li and Jiyi Wang and Gaomin Lin},
  year = {2009},
  doi = {10.1109/GRC.2009.5255104},
  url = {http://dx.doi.org/10.1109/GRC.2009.5255104},
  tags = {rule-based, testing},
  researchr = {https://researchr.org/publication/LiWL09-4},
  cites = {0},
  citedby = {0},
  pages = {368-372},
  booktitle = {The 2009 IEEE International Conference on Granular Computing, GrC 2009, Lushan Mountain, Nanchang, China, 17-19 August 2009},
  publisher = {IEEE},
}