TSDTest: A Efficient Coverage Guided Two-Stage Testing for Deep Learning Systems - researchr publication authors

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Haoran Li, Shihai Wang, Tengfei Shi, Xinyue Fang, Jian Chen. TSDTest: A Efficient Coverage Guided Two-Stage Testing for Deep Learning Systems. In 22nd IEEE International Conference on Software Quality, Reliability, and Security, QRS 2022 - Companion, Guangzhou, China, December 5-9, 2022. pages 173-178, IEEE, 2022. [doi]

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