J. Jenny Li, David M. Weiss, Howell Yee. Code-coverage guided prioritized test generation. Information \& Software Technology, 48(12):1187-1198, 2006. [doi]
@article{LiWY06:0,
title = {Code-coverage guided prioritized test generation},
author = {J. Jenny Li and David M. Weiss and Howell Yee},
year = {2006},
doi = {10.1016/j.infsof.2006.06.007},
url = {http://dx.doi.org/10.1016/j.infsof.2006.06.007},
tags = {test coverage, testing, code generation, coverage},
researchr = {https://researchr.org/publication/LiWY06%3A0},
cites = {0},
citedby = {0},
journal = {Information \& Software Technology},
volume = {48},
number = {12},
pages = {1187-1198},
}