Electrical and photonic I/O test and debug

Mike Li, Takahiro J. Yamaguchi. Electrical and photonic I/O test and debug. In Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, San Jose, CA, USA, September 22-25, 2013. pages 1-2, IEEE, 2013. [doi]

Authors

Mike Li

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Takahiro J. Yamaguchi

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