Xingji Li, Jianqun Yang, Chaoming Liu, Gang Bai, Wenbo Luo, Pengwei Li. Synergistic effects of NPN transistors caused by combined proton irradiations with different energies. Microelectronics Reliability, 82:130-135, 2018. [doi]
@article{LiYLBLL18,
title = {Synergistic effects of NPN transistors caused by combined proton irradiations with different energies},
author = {Xingji Li and Jianqun Yang and Chaoming Liu and Gang Bai and Wenbo Luo and Pengwei Li},
year = {2018},
doi = {10.1016/j.microrel.2018.01.010},
url = {https://doi.org/10.1016/j.microrel.2018.01.010},
researchr = {https://researchr.org/publication/LiYLBLL18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {82},
pages = {130-135},
}