Principal Line-Based Alignment Refinement for Palmprint Recognition

Wei Li 0016, Bob Zhang, Lei Zhang 0006, Jingqi Yan. Principal Line-Based Alignment Refinement for Palmprint Recognition. IEEE Transactions on Systems, Man, and Cybernetics, Part A, 42(6):1491-1499, 2012. [doi]

@article{LiZ0Y12,
  title = {Principal Line-Based Alignment Refinement for Palmprint Recognition},
  author = {Wei Li 0016 and Bob Zhang and Lei Zhang 0006 and Jingqi Yan},
  year = {2012},
  doi = {10.1109/TSMCC.2012.2195653},
  url = {http://dx.doi.org/10.1109/TSMCC.2012.2195653},
  researchr = {https://researchr.org/publication/LiZ0Y12},
  cites = {0},
  citedby = {0},
  journal = {IEEE Transactions on Systems, Man, and Cybernetics, Part A},
  volume = {42},
  number = {6},
  pages = {1491-1499},
}