Learning to Infer Voltage Stability Margin Using Transfer Learning

Jiaming Li, Yue Zhao, Young Hwan Lee, Seung-Jun Kim. Learning to Infer Voltage Stability Margin Using Transfer Learning. In IEEE Data Science Workshop, DSW 2019, Minneapolis, MN, USA, June 2-5, 2019. pages 270-274, IEEE, 2019. [doi]

Authors

Jiaming Li

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Yue Zhao

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Young Hwan Lee

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Seung-Jun Kim

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