A prognostic methodology for power MOSFETs under thermal stress using echo state network and particle filter - researchr publication authors

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Zhongliang Li, Zhixue Zheng, Rachid Outbib. A prognostic methodology for power MOSFETs under thermal stress using echo state network and particle filter. Microelectronics Reliability, 88:350-354, 2018. [doi]

This author has not been identified. Look up 'Zhongliang Li' in GoogleThis author has not been identified. Look up 'Zhixue Zheng' in GoogleThis author has not been identified. Look up 'Rachid Outbib' in Google

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