Scan chain failure analysis using laser voltage imaging

Joy Y. Liao, Steven Kasapi, Bruce Cory, Howard L. Marks, Yin S. Ng. Scan chain failure analysis using laser voltage imaging. Microelectronics Reliability, 50(9-11):1422-1426, 2010. [doi]

Authors

Joy Y. Liao

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Steven Kasapi

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Bruce Cory

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Howard L. Marks

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Yin S. Ng

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