Elizaveta Liivik, Dmitri Vinnikov, Andrii Chub, Yanfeng Shen, Huai Wang, Frede Blaabjerg. Reliability Study of Input Side Capacitors in Impedance-Source PV Microconverters. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 5026-5032, IEEE, 2019. [doi]
@inproceedings{LiivikVCSWB19,
title = {Reliability Study of Input Side Capacitors in Impedance-Source PV Microconverters},
author = {Elizaveta Liivik and Dmitri Vinnikov and Andrii Chub and Yanfeng Shen and Huai Wang and Frede Blaabjerg},
year = {2019},
doi = {10.1109/IECON.2019.8927173},
url = {https://doi.org/10.1109/IECON.2019.8927173},
researchr = {https://researchr.org/publication/LiivikVCSWB19},
cites = {0},
citedby = {0},
pages = {5026-5032},
booktitle = {IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4878-6},
}