Nenad Lilic, Robert Kappel, Georg Roehrer, Horst Zimmermann. Excess Bias Voltage Monitoring Circuit. In IEEE 61st International Midwest Symposium on Circuits and Systems, MWSCAS 2018, Windsor, ON, Canada, August 5-8, 2018. pages 113-116, IEEE, 2018. [doi]
@inproceedings{LilicKRZ18-0,
title = {Excess Bias Voltage Monitoring Circuit},
author = {Nenad Lilic and Robert Kappel and Georg Roehrer and Horst Zimmermann},
year = {2018},
doi = {10.1109/MWSCAS.2018.8623959},
url = {https://doi.org/10.1109/MWSCAS.2018.8623959},
researchr = {https://researchr.org/publication/LilicKRZ18-0},
cites = {0},
citedby = {0},
pages = {113-116},
booktitle = {IEEE 61st International Midwest Symposium on Circuits and Systems, MWSCAS 2018, Windsor, ON, Canada, August 5-8, 2018},
publisher = {IEEE},
isbn = {978-1-5386-7392-8},
}