Chaegang Lim, Yohan Choi, Yunsoo Park, Jaegeun Song, Soonsung Ahn, Sooho Park, Chulwoo Kim. A Capacitively Coupled CT Δ ΣM With Chopping Artifacts Rejection for Sensor Readout ICs. IEEE Trans. Circuits Syst. I Regul. Pap., 68(8):3242-3253, 2021. [doi]
@article{LimCPSAPK21,
title = {A Capacitively Coupled CT Δ ΣM With Chopping Artifacts Rejection for Sensor Readout ICs},
author = {Chaegang Lim and Yohan Choi and Yunsoo Park and Jaegeun Song and Soonsung Ahn and Sooho Park and Chulwoo Kim},
year = {2021},
doi = {10.1109/TCSI.2021.3084350},
url = {https://doi.org/10.1109/TCSI.2021.3084350},
researchr = {https://researchr.org/publication/LimCPSAPK21},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Circuits Syst. I Regul. Pap.},
volume = {68},
number = {8},
pages = {3242-3253},
}