S. S. Lim, Lennie E. N. Lim, Ivan B. H. Lee, Bryan K. A. Ngoi. Multiple domain feature mapping: a methodology based on deep models of features. J. Intelligent Manufacturing, 6(4):245-262, 1995. [doi]
@article{LimLLN95,
title = {Multiple domain feature mapping: a methodology based on deep models of features},
author = {S. S. Lim and Lennie E. N. Lim and Ivan B. H. Lee and Bryan K. A. Ngoi},
year = {1995},
doi = {10.1007/BF00128648},
url = {http://dx.doi.org/10.1007/BF00128648},
researchr = {https://researchr.org/publication/LimLLN95},
cites = {0},
citedby = {0},
journal = {J. Intelligent Manufacturing},
volume = {6},
number = {4},
pages = {245-262},
}