Carlston Lim, Yang Xue, Xin Li 0001, Ronald D. Blanton, M. Enamul Amyeen. Diagnostic resolution improvement through learning-guided physical failure analysis. In 2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016. pages 1-10, IEEE, 2016. [doi]
@inproceedings{LimX0BA16,
title = {Diagnostic resolution improvement through learning-guided physical failure analysis},
author = {Carlston Lim and Yang Xue and Xin Li 0001 and Ronald D. Blanton and M. Enamul Amyeen},
year = {2016},
doi = {10.1109/TEST.2016.7805824},
url = {http://dx.doi.org/10.1109/TEST.2016.7805824},
researchr = {https://researchr.org/publication/LimX0BA16},
cites = {0},
citedby = {0},
pages = {1-10},
booktitle = {2016 IEEE International Test Conference, ITC 2016, Fort Worth, TX, USA, November 15-17, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8773-6},
}