Elen Lima, Christophe Mues, Bart Baesens. Monitoring and backtesting churn models. Expert Syst. Appl., 38(1):975-982, 2011. [doi]
@article{LimaMB11,
title = {Monitoring and backtesting churn models},
author = {Elen Lima and Christophe Mues and Bart Baesens},
year = {2011},
doi = {10.1016/j.eswa.2010.07.091},
url = {http://dx.doi.org/10.1016/j.eswa.2010.07.091},
tags = {meta-model, Meta-Environment},
researchr = {https://researchr.org/publication/LimaMB11},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {38},
number = {1},
pages = {975-982},
}