Silent Intruders: Unveiling Security Flaws in BLE Smart Locks

Jing Lin, Zhide Chen, Xu Yang 0002, Xuechao Yang, Xiaoding Wang 0001, Xun Yi, Md. Jalil Piran. Silent Intruders: Unveiling Security Flaws in BLE Smart Locks. IEEE Trans. Consumer Electronics, 71(4):11875-11891, November 2025. [doi]

@article{LinCYYWYP25,
  title = {Silent Intruders: Unveiling Security Flaws in BLE Smart Locks},
  author = {Jing Lin and Zhide Chen and Xu Yang 0002 and Xuechao Yang and Xiaoding Wang 0001 and Xun Yi and Md. Jalil Piran},
  year = {2025},
  month = {November},
  doi = {10.1109/TCE.2025.3619417},
  url = {https://doi.org/10.1109/TCE.2025.3619417},
  researchr = {https://researchr.org/publication/LinCYYWYP25},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Consumer Electronics},
  volume = {71},
  number = {4},
  pages = {11875-11891},
}