Yu-Hsin Lin, Ching-En Lee. A total standard WIP estimation method for wafer fabrication. European Journal of Operational Research, 131(1):78-94, 2001. [doi]
@article{LinL01-1,
title = {A total standard WIP estimation method for wafer fabrication},
author = {Yu-Hsin Lin and Ching-En Lee},
year = {2001},
doi = {10.1016/S0377-2217(99)00446-4},
url = {http://dx.doi.org/10.1016/S0377-2217(99)00446-4},
researchr = {https://researchr.org/publication/LinL01-1},
cites = {0},
citedby = {0},
journal = {European Journal of Operational Research},
volume = {131},
number = {1},
pages = {78-94},
}