The Impacts of Untestable Defects on Transition Fault Testing

Xijiang Lin, Janusz Rajski. The Impacts of Untestable Defects on Transition Fault Testing. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 2-7, IEEE Computer Society, 2006. [doi]

Authors

Xijiang Lin

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Janusz Rajski

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