Deep LAC: Deep localization, alignment and classification for fine-grained recognition - researchr publication authors

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Di Lin, Xiaoyong Shen, Cewu Lu, Jiaya Jia. Deep LAC: Deep localization, alignment and classification for fine-grained recognition. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2015, Boston, MA, USA, June 7-12, 2015. pages 1666-1674, IEEE, 2015. [doi]

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