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CMOS Built-In Test Architecture for High-Speed Jitter Measurement

Henry C. Lin, Karen Taylor, Alan Chong, Eddie Chan, Mani Soma, Hosam Haggag, Jeff Huard, Jim Braatz. CMOS Built-In Test Architecture for High-Speed Jitter Measurement. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 67-76, IEEE Computer Society, 2003. [doi]

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Henry C. Lin

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Karen Taylor

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Alan Chong

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Eddie Chan

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Mani Soma

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Hosam Haggag

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Jeff Huard

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Jim Braatz

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