On Harmonizing Data Lifetime and Block Retention Time for Flash Devices

Yi-Ling Lin, Ming-Chang Yang, Yuan-Hao Chang, Che-Wei Chang, Shuo-Han Chen. On Harmonizing Data Lifetime and Block Retention Time for Flash Devices. In IEEE 7th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2018, Hakodate, Sapporo, Japan, August 28-31, 2018. pages 73-78, IEEE, 2018. [doi]

@inproceedings{LinYCCC18,
  title = {On Harmonizing Data Lifetime and Block Retention Time for Flash Devices},
  author = {Yi-Ling Lin and Ming-Chang Yang and Yuan-Hao Chang and Che-Wei Chang and Shuo-Han Chen},
  year = {2018},
  doi = {10.1109/NVMSA.2018.00020},
  url = {https://doi.org/10.1109/NVMSA.2018.00020},
  researchr = {https://researchr.org/publication/LinYCCC18},
  cites = {0},
  citedby = {0},
  pages = {73-78},
  booktitle = {IEEE 7th Non-Volatile Memory Systems and Applications Symposium, NVMSA 2018, Hakodate, Sapporo, Japan, August 28-31, 2018},
  publisher = {IEEE},
  isbn = {978-1-5386-7403-1},
}