Regularized LTI system identification in the presence of outliers: A variational EM approach

Martin Lindfors, Tianshi Chen. Regularized LTI system identification in the presence of outliers: A variational EM approach. Automatica, 121:109152, 2020. [doi]

@article{LindforsC20,
  title = {Regularized LTI system identification in the presence of outliers: A variational EM approach},
  author = {Martin Lindfors and Tianshi Chen},
  year = {2020},
  doi = {10.1016/j.automatica.2020.109152},
  url = {https://doi.org/10.1016/j.automatica.2020.109152},
  researchr = {https://researchr.org/publication/LindforsC20},
  cites = {0},
  citedby = {0},
  journal = {Automatica},
  volume = {121},
  pages = {109152},
}