Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
J. Jay Liu. Machine Learning-based Automatic Defect Classification in Real Manufacturing Settings. In International Conference on Control, Automation and Diagnosis, ICCAD 2023, Rome, Italy, May 10-12, 2023. pages 1-5, IEEE, 2023. [doi]