Zhoufeng Liu, Jian Cui, Chunlei Li 0002, Miaomiao Wei, Yan Yang. Fabric Defect Detection Based on Lightweight Neural Network. In Zhouchen Lin, Liang Wang 0001, Jian Yang 0003, Guangming Shi, Tieniu Tan, Nanning Zheng, Xilin Chen, Yanning Zhang, editors, Pattern Recognition and Computer Vision - Second Chinese Conference, PRCV 2019, Xi'an, China, November 8-11, 2019, Proceedings, Part I. Volume 11857 of Lecture Notes in Computer Science, pages 528-539, Springer, 2019. [doi]
@inproceedings{LiuC0WY19,
title = {Fabric Defect Detection Based on Lightweight Neural Network},
author = {Zhoufeng Liu and Jian Cui and Chunlei Li 0002 and Miaomiao Wei and Yan Yang},
year = {2019},
doi = {10.1007/978-3-030-31654-9_45},
url = {https://doi.org/10.1007/978-3-030-31654-9_45},
researchr = {https://researchr.org/publication/LiuC0WY19},
cites = {0},
citedby = {0},
pages = {528-539},
booktitle = {Pattern Recognition and Computer Vision - Second Chinese Conference, PRCV 2019, Xi'an, China, November 8-11, 2019, Proceedings, Part I},
editor = {Zhouchen Lin and Liang Wang 0001 and Jian Yang 0003 and Guangming Shi and Tieniu Tan and Nanning Zheng and Xilin Chen and Yanning Zhang},
volume = {11857},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-030-31654-9},
}