Baojun Liu, Li Cai. Reliability Evaluation for Single Event Transients on Digital Circuits. IEEE Transactions on Reliability, 61(3):687-691, 2012. [doi]
@article{LiuC12-19,
title = {Reliability Evaluation for Single Event Transients on Digital Circuits},
author = {Baojun Liu and Li Cai},
year = {2012},
doi = {10.1109/TR.2012.2209249},
url = {http://dx.doi.org/10.1109/TR.2012.2209249},
researchr = {https://researchr.org/publication/LiuC12-19},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Reliability},
volume = {61},
number = {3},
pages = {687-691},
}