Linlin Liu, Dongming Fan, Zili Wang, Dezhen Yang, Jingjing Cui, Xinrui Ma, Yi Ren 0003. Enhanced GO methodology to support failure mode, effects and criticality analysis. J. Intelligent Manufacturing, 30(3):1451-1468, 2019. [doi]
@article{LiuFWYCMR19,
title = {Enhanced GO methodology to support failure mode, effects and criticality analysis},
author = {Linlin Liu and Dongming Fan and Zili Wang and Dezhen Yang and Jingjing Cui and Xinrui Ma and Yi Ren 0003},
year = {2019},
doi = {10.1007/s10845-017-1336-0},
url = {https://doi.org/10.1007/s10845-017-1336-0},
researchr = {https://researchr.org/publication/LiuFWYCMR19},
cites = {0},
citedby = {0},
journal = {J. Intelligent Manufacturing},
volume = {30},
number = {3},
pages = {1451-1468},
}