Intelligent Recognition of Internal Defect Signals in Composite Insulators Based on Variational Mode Decomposition and Random Forest Algorithm

Junbo Liu, Changlong Gao, Yufeng Tai, Jinyao Luan, Saipeng Zhang. Intelligent Recognition of Internal Defect Signals in Composite Insulators Based on Variational Mode Decomposition and Random Forest Algorithm. In 5th International Conference on Machine Learning and Computer Application, ICMLCA 2024, Hangzhou, China, October 18-20, 2024. pages 30-34, IEEE, 2024. [doi]

Bibliographies