Enhanced Limit-of-Detection of Current Sensor Based on Tunneling Magnetoresistive Effect With Multichips Differential Design

Jiaming Liu, Mengmeng Guan, Yiwei Xu, Shuang Zhao, Wei Su, Cuiling Zhang, Zhiguang Wang, Xiaohui Zhang, Zhongqiang Hu, Zhuangde Jiang, Ming Liu. Enhanced Limit-of-Detection of Current Sensor Based on Tunneling Magnetoresistive Effect With Multichips Differential Design. IEEE T. Instrumentation and Measurement, 72:1-9, 2023. [doi]

@article{LiuGXZSZWZHJL23,
  title = {Enhanced Limit-of-Detection of Current Sensor Based on Tunneling Magnetoresistive Effect With Multichips Differential Design},
  author = {Jiaming Liu and Mengmeng Guan and Yiwei Xu and Shuang Zhao and Wei Su and Cuiling Zhang and Zhiguang Wang and Xiaohui Zhang and Zhongqiang Hu and Zhuangde Jiang and Ming Liu},
  year = {2023},
  doi = {10.1109/TIM.2023.3322494},
  url = {https://doi.org/10.1109/TIM.2023.3322494},
  researchr = {https://researchr.org/publication/LiuGXZSZWZHJL23},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {72},
  pages = {1-9},
}