Chunting Liu, Xiaotao Han, Qi Chen, Zelin Wu, Daikun Wei, Jie Ren. Non-contact electrical resistivity measuring system based on BP neural network. In IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018. pages 1-6, IEEE, 2018. [doi]
@inproceedings{LiuHCWWR18,
title = {Non-contact electrical resistivity measuring system based on BP neural network},
author = {Chunting Liu and Xiaotao Han and Qi Chen and Zelin Wu and Daikun Wei and Jie Ren},
year = {2018},
doi = {10.1109/I2MTC.2018.8409680},
url = {https://doi.org/10.1109/I2MTC.2018.8409680},
researchr = {https://researchr.org/publication/LiuHCWWR18},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2018, Houston, TX, USA, May 14-17, 2018},
publisher = {IEEE},
isbn = {978-1-5386-2222-3},
}